Semiconductor AOI Inspection Platforms

SQ3000S is an all-in-one solution equipped with powerful tools covering inspection and measurement for AOI, SPI and CMM applications. The SQ3000S uses the revolutionary Multi-Reflection Suppression® (MRS®) technology to precisely identify and eliminate reflections caused by shiny parts, delivering unmatched accuracy. Effective suppression of multiple reflections is essential for accurate measurement, making MRS an ideal technical solution for a wide range of applications, including those with the most demanding quality requirements.